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 STGF10NB60SD
N-CHANNEL 10A - 600V TO-220FP PowerMESHTM IGBT
TYPE STGF10NB60SD
s
VCES 600
VCE(sat) (Max) @25C < 1.8 V
IC @100C 10 A
s s s s
HIGHT INPUT IMPEDANCE (VOLTAGE DRIVEN) LOW ON-VOLTAGE DROP HIGH CURRENT CAPABILITY OFF LOSSES INCLUDE TAIL CURRENT CO-PACKAGED WITH TURBOSWITCHTM ANTIPARALLEL DIODE
3 1 2
TO-220FP
DESCRIPTION Using the latest high voltage technology based on a patented strip layout, STMicroelectronics has designed an advanced family of IGBTs, the PowerMESHTM IGBTs, with outstanding performances. The suffix "S" identifies a family optimized achieve minimum on-voltage drop for low frequency applications (<1kHz). APPLICATIONS s LIGHT DIMMER s STATIC RELAYS s MOTOR CONTROL
INTERNAL SCHEMATIC DIAGRAM
ABSOLUTE MAXIMUM RATINGS
Symbol VCES VECR VGE IC IC ICM (q) PTOT VISO Tstg Tj Parameter Collector-Emitter Voltage (VGS = 0) Reverse Battery Protection Gate-Emitter Voltage Collector Current (continuous) at TC = 25C Collector Current (continuous) at TC = 100C Collector Current (pulsed) Total Dissipation at TC = 25C Derating Factor Insulation Withstand Voltage A.C.(t = 1 sec; Tc = 25C) Storage Temperature Max. Operating Junction Temperature Value 600 20 20 20 10 80 25 0.2 2500 -65 to 150 150 Unit V V V A A A W W/C V C C
(q ) Pulse width limited by safe operating area
June 2003
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STGF10NB60SD
THERMAL DATA
Rthj-case Rthj-amb Thermal Resistance Junction-case Max Thermal Resistance Junction-ambient Max 5 62.5 C/W C/W
ELECTRICAL CHARACTERISTICS (TCASE = 25 C UNLESS OTHERWISE SPECIFIED) OFF
Symbol VBR(CES) VBR(CES) ICES IGES Parameter Collector-Emitter Break-down Voltage Emitter Collector Break-down Voltage Collector cut-off Current (VGE = 0) Gate-Emitter Leakage Current (VCE = 0) Test Conditions IC = 250 A, VGE = 0, IC = 1 mA, VGE = 0, VCE = Max Rating ,Tj =25 C VCE = Max Rating ,Tj =125 C VGE = 20V , VCE = 0 Min. 600 20 10 100 100 Typ. Max. Unit V V A A nA
ON (1)
Symbol VGE(th) VCE(SAT) Parameter Gate Threshold Voltage Collector-Emitter Saturation Voltage Test Conditions VCE = VGE, IC = 250A VGE =15V, IC = 5 A, Tj= 25C VGE =15V, IC = 10 A, Tj= 25C VGE =15V, IC = 10 A, Tj= 125C Min. 2.5 1.15 1.35 1.25 Typ. Max. 5 1.8 Unit V V V V
DYNAMIC
Symbol gfs Cies Coes Cres Qg ICL Parameter Forward Transconductance Input Capacitance Output Capacitance Reverse Transfer Capacitance Gate Charge Latching Current Test Conditions VCE = 25 V , IC =10 A VCE = 25V, f = 1 MHz, VGE = 0 VCE = 400V, IC = 10 A, VGE = 15V Vclamp= 480V, RG= 1k, Tj= 125C 20 Min. 5 610 65 12 33 Typ. Max. Unit S pF pF pF nC A
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STGF10NB60SD
SWITCHING ON
Symbol td(on) tr (di/dt)on Eon Parameter Turn-on Delay Time Rise Time Turn-on Current Slope Turn-on Switching Losses Test Conditions VCC = 480 V, IC = 10 A RG = 1K , VGE = 15 V VCC= 480 V, IC = 10 A RG=1K, VGE = 15 V Min. Typ. 0.7 0.46 8 0.6 Max. Unit s s A/s mJ
SWITCHING OFF
Symbol tc tr(Voff) tf Eoff(**) tc tr(Voff) tf Eoff(**) Parameter Cross-over Time Off Voltage Rise Time Fall Time Turn-off Switching Loss Cross-over Time Off Voltage Rise Time Fall Time Turn-off Switching Loss Vclamp = 480 V, IC = 10 A, RGE = 1K , VGE = 15 V Tj = 125 C Test Conditions Vclamp = 480 V, IC = 10 A, RGE = 1K , VGE = 15 V Min. Typ. 2.2 1.2 1.2 5.0 3.8 1.2 1.9 8.0 Max. Unit s s s mJ s s s mJ
COLLECTOR-EMITTER DIODE
Symbol If Ifm Vf trr Qrr Irrm Parameter Forward Current Forward Current pulsed Forward On-Voltage Reverse Recovery Time Reverse Recovery Charge Reverse Recovery Current If = 3.5 A If = 3.5 A, Tj = 125 C If = 7 A ,VR = 20 V, Tj =125C, di/dt = 100A/s 1.4 1.15 50 70 2.7 Test Conditions Min. Typ. Max. 7 56 1.9 Unit A A V V ns nC A
(q)Pulsed: Pulse duration = 300 s, duty cycle 1.5 %. (1)Pulse width limited by max. junction temperature. (**)Losses Include Also the Tail
Switching Off Safe Operating Area
Thermal Impedance
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STGF10NB60SD
Output Characteristics Transfer Characteristics
Transconductance
Collector-Emitter On Voltage vs Temperature
Collector-Emitter On Voltage vs Collector Current
Gate Threshold Voltage vs Temperature
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STGF10NB60SD
Capacitance Variations Gate Charge vs Gate-Emitter Voltage
Off Losses vs Gate Resistance
Off Losses vs Collector Current
Normalized Break-down Voltage vs Temp.
Off Losses vs Temperature
5/8
STGF10NB60SD
Emitter-Collector Diode Characteristics
Fig. 1: Gate Charge test Circuit
Fig. 2: Test Circuit For Inductive Load Switching
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STGF10NB60SD
TO-220FP MECHANICAL DATA
mm. MIN. 4.4 2.5 2.5 0.45 0.75 1.15 1.15 4.95 2.4 10 16 28.6 9.8 2.9 15.9 9 3 30.6 10.6 3.6 16.4 9.3 3.2 1.126 .0385 0.114 0.626 0.354 0.118 TYP MAX. 4.6 2.7 2.75 0.7 1 1.5 1.5 5.2 2.7 10.4 MIN. 0.173 0.098 0.098 0.017 0.030 0.045 0.045 0.195 0.094 0.393 0.630 1.204 0.417 0.141 0.645 0.366 0.126 inch TYP. MAX. 0.181 0.106 0.108 0.027 0.039 0.067 0.067 0.204 0.106 0.409
DIM. A B D E F F1 F2 G G1 H L2 L3 L4 L5 L6 L7 O
A
B
L3 L6 L7
F1 F
D
G1 H
F2
L2 L5
E
123
L4
G
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STGF10NB60SD
Information furnished is believed to be accurate and reliable. However, STMicroelectronics assumes no responsibility for the consequences of use of such information nor for any infringement of patents or other rights of third parties which may result from its use. No license is granted by implication or otherwise under any patent or patent rights of STMicroelectronics. Specifications mentioned in this publication are subject to change without notice. This publication supersedes and replaces all information previously supplied. STMicroelectronics products are not authorized for use as critical components in life support devices or systems without express written approval of STMicroelectronics. (c) The ST logo is a registered trademark of STMicroelectronics (c) 2003 STMicroelectronics - Printed in Italy - All Rights Reserved STMicroelectronics GROUP OF COMPANIES Australia - Brazil - Canada - China - Finland - France - Germany - Hong Kong - India - Israel - Italy - Japan - Malaysia - Malta - Morocco Singapore - Spain - Sweden - Switzerland - United Kingdom - United States. (c) http://www.st.com
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